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Structural, photoluminescence and XPS properties of Tm3þ ions in ZnO nanostructures

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dc.contributor.author Kabongo, GL
dc.contributor.author Mhlongo, Gugu H
dc.contributor.author Mothudi, BM
dc.contributor.author Hillie, Kenneth T
dc.contributor.author Mbule, PS
dc.contributor.author Dhlamini, MS
dc.date.accessioned 2018-02-06T11:02:59Z
dc.date.available 2018-02-06T11:02:59Z
dc.date.issued 2017-07
dc.identifier.citation Kabongo, G.L. et al. 2017. Structural, photoluminescence and XPS properties of Tm3þ ions in ZnO nanostructures. Journal of Luminescence, vol. 187: 141-153 en_US
dc.identifier.issn 0022-2313
dc.identifier.issn 1872-7883
dc.identifier.uri https://www.sciencedirect.com/science/article/pii/S0022231316302770
dc.identifier.uri doi.org/10.1016/j.jlumin.2017.02.024
dc.identifier.uri http://hdl.handle.net/10204/10021
dc.description Copyright: 2017 Elsevier. Due to copyright restrictions, the attached PDF file only contains the abstract of the full text item. For access to the full text item, please consult the publisher's website. en_US
dc.description.abstract In the present study, a succession of thulium (Tm)-doped zinc oxide (ZnO) nanostructures samples were prepared by sol-gel method using zinc acetate dihydrate, thulium nitrate pentahydrate and sodium hydroxide species with absolute ethanol as solvent. The X-Ray diffraction (XRD) revealed phase purity (hexagonal Würtzite structure) and high crystalline nature of both Tm(sup3+) doped and undoped ZnO samples. Furthermore, defects mediated levels in the samples were investigated by means of photoluminescence (PL) spectroscopy. Finally, Tm 4d core level was detected in ZnO: 0.5 mol% Tm(sup3+) sample from high resolution X-Ray Photoelectron Spectroscopy (XPS) scan. en_US
dc.language.iso en en_US
dc.publisher Elsevier en_US
dc.relation.ispartofseries Worklist;20152
dc.subject ZnO nanostructures en_US
dc.subject Thulium en_US
dc.subject Bandgap en_US
dc.subject XPS en_US
dc.subject O 1s en_US
dc.subject Tm 4d en_US
dc.title Structural, photoluminescence and XPS properties of Tm3þ ions in ZnO nanostructures en_US
dc.type Article en_US
dc.identifier.apacitation Kabongo, G., Mhlongo, G. H., Mothudi, B., Hillie, K. T., Mbule, P., & Dhlamini, M. (2017). Structural, photoluminescence and XPS properties of Tm3þ ions in ZnO nanostructures. http://hdl.handle.net/10204/10021 en_ZA
dc.identifier.chicagocitation Kabongo, GL, Gugu H Mhlongo, BM Mothudi, Kenneth T Hillie, PS Mbule, and MS Dhlamini "Structural, photoluminescence and XPS properties of Tm3þ ions in ZnO nanostructures." (2017) http://hdl.handle.net/10204/10021 en_ZA
dc.identifier.vancouvercitation Kabongo G, Mhlongo GH, Mothudi B, Hillie KT, Mbule P, Dhlamini M. Structural, photoluminescence and XPS properties of Tm3þ ions in ZnO nanostructures. 2017; http://hdl.handle.net/10204/10021. en_ZA
dc.identifier.ris TY - Article AU - Kabongo, GL AU - Mhlongo, Gugu H AU - Mothudi, BM AU - Hillie, Kenneth T AU - Mbule, PS AU - Dhlamini, MS AB - In the present study, a succession of thulium (Tm)-doped zinc oxide (ZnO) nanostructures samples were prepared by sol-gel method using zinc acetate dihydrate, thulium nitrate pentahydrate and sodium hydroxide species with absolute ethanol as solvent. The X-Ray diffraction (XRD) revealed phase purity (hexagonal Würtzite structure) and high crystalline nature of both Tm(sup3+) doped and undoped ZnO samples. Furthermore, defects mediated levels in the samples were investigated by means of photoluminescence (PL) spectroscopy. Finally, Tm 4d core level was detected in ZnO: 0.5 mol% Tm(sup3+) sample from high resolution X-Ray Photoelectron Spectroscopy (XPS) scan. DA - 2017-07 DB - ResearchSpace DP - CSIR KW - ZnO nanostructures KW - Thulium KW - Bandgap KW - XPS KW - O 1s KW - Tm 4d LK - https://researchspace.csir.co.za PY - 2017 SM - 0022-2313 SM - 1872-7883 T1 - Structural, photoluminescence and XPS properties of Tm3þ ions in ZnO nanostructures TI - Structural, photoluminescence and XPS properties of Tm3þ ions in ZnO nanostructures UR - http://hdl.handle.net/10204/10021 ER - en_ZA


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