In the present study, a succession of thulium (Tm)-doped zinc oxide (ZnO) nanostructures samples were prepared by sol-gel method using zinc acetate dihydrate, thulium nitrate pentahydrate and sodium hydroxide species with absolute ethanol as solvent. The X-Ray diffraction (XRD) revealed phase purity (hexagonal Würtzite structure) and high crystalline nature of both Tm(sup3+) doped and undoped ZnO samples. Furthermore, defects mediated levels in the samples were investigated by means of photoluminescence (PL) spectroscopy. Finally, Tm 4d core level was detected in ZnO: 0.5 mol% Tm(sup3+) sample from high resolution X-Ray Photoelectron Spectroscopy (XPS) scan.
Reference:
Kabongo, G.L. et al. 2017. Structural, photoluminescence and XPS properties of Tm3þ ions in ZnO nanostructures. Journal of Luminescence, vol. 187: 141-153
Kabongo, G., Mhlongo, G. H., Mothudi, B., Hillie, K. T., Mbule, P., & Dhlamini, M. (2017). Structural, photoluminescence and XPS properties of Tm3þ ions in ZnO nanostructures. http://hdl.handle.net/10204/10021
Kabongo, GL, Gugu H Mhlongo, BM Mothudi, Kenneth T Hillie, PS Mbule, and MS Dhlamini "Structural, photoluminescence and XPS properties of Tm3þ ions in ZnO nanostructures." (2017) http://hdl.handle.net/10204/10021
Kabongo G, Mhlongo GH, Mothudi B, Hillie KT, Mbule P, Dhlamini M. Structural, photoluminescence and XPS properties of Tm3þ ions in ZnO nanostructures. 2017; http://hdl.handle.net/10204/10021.
Copyright: 2017 Elsevier. Due to copyright restrictions, the attached PDF file only contains the abstract of the full text item. For access to the full text item, please consult the publisher's website.
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