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Characterisation of InAs-based epilayers by FTIR spectroscopy
Baisitse, TR
;
Forbes, A
;
Katumba, G
;
Botha, JR
;
Engelbrecht, JAA
(
John Wiley & Sons Ltd
,
2008
)
Electrical properties of undoped and doped MOVPE-grown InAsSb
Krug, T
;
Botha, L
;
Shamba, P
;
Baisitse, TR
;
Venter, A
;
Engelbrecht, JAA
;
Botha, JR
(
Elsevier Science BV
,
2006
)
Metalorganic vapour epitaxial growth and infrared characterisation of InAsSb and InAs on InAs substrates
Baisitse, TR
;
Botha, JR
;
Engelbrecht, JA
(
2006-07
)
Carbon-in-silica composite selective solar absorbers: a determination of composition and dielectic properties - SAIP Poster
Katumba, G
;
Baisitse, T
;
Forbes, A
;
Olumekor, L
;
Wackelgard, E
(
2006-07
)
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Baisitse, TR (3)
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Engelbrecht, JAA (2)
Forbes, A (2)
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51st Annual Conference of the SAIP (1)
Analysis methods (1)
Carbon nano-chains (1)
Carbon volume (1)
Composite coating (1)
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Films thickness (1)
GaAs (1)
Hall measurements (1)
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