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Formation of HgSe thin films using electrochemical atomic Layer epitaxy

Author: Mathe, Mahlanyane K ; Cox, SM ; Venkatasamy, V ; Happek, U ; Stickney, JL Date: Sep 2005 The growth of HgSe using electrochemical atomic-layer epitaxy (EC-ALE) is reported. EC-ALE is the electrochemical analog of ALE, where electrochemical surface-limited reactions referred to as underpotential deposits, generally result in the ... Read more

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Browsing by Subject "X-ray diffraction analysis"

Browsing by Subject "X-ray diffraction analysis"

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