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Modification to an Auger Electron Spectroscopy system for measuring segregation in a bi-crystal

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dc.contributor.author Jafta, CJ
dc.contributor.author Roos, WD
dc.contributor.author Terblans, JJ
dc.date.accessioned 2013-09-30T08:05:40Z
dc.date.available 2013-09-30T08:05:40Z
dc.date.issued 2013-03
dc.identifier.citation Jafta, C.J, Roos, W.D and Terblans, J.J. 2013. Modification to an Auger Electron Spectroscopy system for measuring segregation in a bi-crystal. Journal of Instrumentation, vol. 8, pp 1-6 en_US
dc.identifier.issn 1748-0221
dc.identifier.uri http://hdl.handle.net/10204/6970
dc.description Copyright: 2013 IOP Publishing. This is an ABSTRACT ONLY. The definition version is published in Journal of Instrumentation, vol. 8, pp 1-6 en_US
dc.description.abstract It is reported that different crystal surface orientations yield different segregation fluxes. Although there were a few attempts to confirm these predictions experimentally, it is very difficult to compare data without making a few assumptions. Parameters like temperature measurement, crystal history and spectrometer variables are all adding to the complexity of directly comparing the segregation behaviour from one crystal to another. This investigation makes use of a Cu bi-crystal, modifications to the scanning control unit of the AES electron beam to eliminate the difference in experimental parameters and specialized written software to automate the data acquisition process. This makes direct comparison of segregation parameters on two different orientations possible. The paper describes the electron beam modifications, experimental setup and procedures, as well as the software developed to control the electron beam and automate data acquisition. en_US
dc.language.iso en en_US
dc.publisher IOP Publishing en_US
dc.relation.ispartofseries Workflow;11478
dc.subject Auger Electron Spectroscopy en_US
dc.subject Electron beam modifications en_US
dc.subject Data distribution en_US
dc.subject Archiving en_US
dc.subject Detector design en_US
dc.subject Construction technologies en_US
dc.title Modification to an Auger Electron Spectroscopy system for measuring segregation in a bi-crystal en_US
dc.type Article en_US
dc.identifier.apacitation Jafta, C., Roos, W., & Terblans, J. (2013). Modification to an Auger Electron Spectroscopy system for measuring segregation in a bi-crystal. http://hdl.handle.net/10204/6970 en_ZA
dc.identifier.chicagocitation Jafta, CJ, WD Roos, and JJ Terblans "Modification to an Auger Electron Spectroscopy system for measuring segregation in a bi-crystal." (2013) http://hdl.handle.net/10204/6970 en_ZA
dc.identifier.vancouvercitation Jafta C, Roos W, Terblans J. Modification to an Auger Electron Spectroscopy system for measuring segregation in a bi-crystal. 2013; http://hdl.handle.net/10204/6970. en_ZA
dc.identifier.ris TY - Article AU - Jafta, CJ AU - Roos, WD AU - Terblans, JJ AB - It is reported that different crystal surface orientations yield different segregation fluxes. Although there were a few attempts to confirm these predictions experimentally, it is very difficult to compare data without making a few assumptions. Parameters like temperature measurement, crystal history and spectrometer variables are all adding to the complexity of directly comparing the segregation behaviour from one crystal to another. This investigation makes use of a Cu bi-crystal, modifications to the scanning control unit of the AES electron beam to eliminate the difference in experimental parameters and specialized written software to automate the data acquisition process. This makes direct comparison of segregation parameters on two different orientations possible. The paper describes the electron beam modifications, experimental setup and procedures, as well as the software developed to control the electron beam and automate data acquisition. DA - 2013-03 DB - ResearchSpace DP - CSIR KW - Auger Electron Spectroscopy KW - Electron beam modifications KW - Data distribution KW - Archiving KW - Detector design KW - Construction technologies LK - https://researchspace.csir.co.za PY - 2013 SM - 1748-0221 T1 - Modification to an Auger Electron Spectroscopy system for measuring segregation in a bi-crystal TI - Modification to an Auger Electron Spectroscopy system for measuring segregation in a bi-crystal UR - http://hdl.handle.net/10204/6970 ER - en_ZA


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