Author:Zandamela, Frank; Pratt, Lawrence E; May, Siyasanga I; Mkasi, Hlaluku W; Mabeo, Reuben TDate:Nov 2023There has been significant research on the relationship between current-voltage (I-V) curve characteristics and electroluminescence (EL) module defects. Current methods use EL image pixels to develop features, which are then correlated with ...Read more